Monitoring Flash Health of Gateway. Flash devices are detected by the
gateway during boot. Flash wear monitoring can be enabled per device.
{{numentries}}
Represents the eMMC or NAND flash device present in the gateway.
Indicates flash device type.
Name for the flash device.
System Path to the flash device folder based on the uri scheme
{{bibref|RFC8089|The file URI Scheme}}.
Hardware version of the flash device.
This gives health status of the flash device(agnostic of NAND or eMMC).
Indicates whether flash device monitoring is enabled for this device.
This provides monitoring status of the flash device.
Monitoring disabled for the flash device.
Successfully monitoring the flash device.
Flash monitoring errored.
Flash monitoring is not supported for this flash device.
Health Status of monitored flash device.
Normal health of Flash device.
Lifetime of the Flash Device is limited.
Overall pre-EOL status information for reserved blocks as specified in
bibref|JEDEC84-B50|Section 7.4.21.
Not defined.
Consumed less than 80% of the reserved blocks.
Consumed 80% of the reserved blocks.
Consumed 90% of the reserved blocks.
Life time state reflected by the averaged wear out of
memory of Type A relative to its maximum estimated device life time.
bibref|JEDEC84-B50|Section 7.4.20.
Indicates NormalLife of the flash device. Percentage of wear out
further defined by {{param|LifeTimeAPercent}}.
Device lifetime in {{units}} represented by the
average wear of Type A memory, relative to its maximum estimated
lifetime, when {{param|LifeTimeAState}} is Normal, see
bibref|JEDEC84-B50|Section 7.4.20.
Life time state reflected by the averaged wear out of
memory of Type B relative to its maximum estimated device life time.
bibref|JEDEC84-B50|Section 7.4.19.
Indicates NormalLife of the flash device. Percentage of wear out
further defined by {{param|LifeTimeBPercent}}.
Device lifetime in {{units}} represented by the
average wear of Type B memory, relative to its maximum estimated
lifetime, when {{param|LifeTimeAState}} is Normal, see
bibref|JEDEC84-B50|Section 7.4.19.
Raw DEVICE_LIFE_TIME_EST_TYP_A [268] output as per
bibref|JEDEC84-B50|Section 7.4.20.
This field shows an estimated
device lifetime based on the average memory wear of Type A compared to
its maximum expected lifetime.
Raw DEVICE_LIFE_TIME_EST_TYP_B output as per
bibref|JEDEC84-B50|Section 7.4.19.
This field shows an estimated
device lifetime based on the average memory wear of Type B compared to
its maximum expected lifetime.
Threshold value for {{param|LifeTimeAHex}}. If the
{{param|LifeTimeAHex}} value crosses this threshold, set
{{param|HealthStatus}} as Critical.
Threshold value for {{param|LifeTimeBHex}}. If the
{{param|LifeTimeBHex}} value crosses this threshold, set
{{param|HealthStatus}} as Critical.
Threshold value for {{param|EMMCPreEoLInfo}}. If the
{{param|EMMCPreEoLInfo}} exceeds this threshold, set
{{param|HealthStatus}} as Critical.
Total Bad Blocks if the flash is a NAND type.
Total Good Blocks if the flash is a NAND type.
Threshold value for Maximum Bad Blocks if the flash is NAND. If
{{param|TotalBadBlocks}} exceeds this threshold, set
{{param|HealthStatus}} as Critical.
This event is triggered when the flash device health status exceeds
the configured threshold. If {{param|Enabled}} is {{true}}, the event
occurs when the parameter value exceeds the threshold for any of the
following parameters: {{param|LifeTimeAThreshold}} exceeds {{param|LifeTimeAPercent}},
{{param|LifeTimeBThreshold}} exceeds {{param|LifeTimeBPercent}},
{{param|PreEolThreshold}} exceeds {{param|EMMCPreEoLInfo}} in case of eMMC flash device, or
{{param|TotalBadBlocks}} exceeds {{param|BadBlocksThreshold}} in case
of NAND flash device.
Name of the flash device associated with this event.
{{param|##.FlashDevice.{i}.Name}}.